marco135
May 13th, 2016, 11:05 PM
Hi guys,
I'm new to this forum and quite new to Ubuntu, so you can call me a noob. I have UBUNTU KXSTUDIO Studio (Ubuntu 14.04.4 LTS) running on a new PC since January this year. There was a kernel update 3 days ago and after this update i'm not able to boot with the kernel 3.13.0-86-lowlatency. However with kernel version 3.13.0-85-lowlatency it works after I entered grub. The message I get is:
— Boot args (cat /proc/cmdline)
— Check rootdelay= (did the system wait long enough?)
— Check root= (did the system wait for the right device?)
— Missing modules (cat /proc/modules; ls /dev)
ALERT! /dev/disk/kxstudio--vg-root does not exist. Dropping to a shell!
BusyBox v.1.21.1 (ubuntu 1:1.21.0-1ubuntu1) built-in shell (ash)
Enter 'help' for list of built-in commands .
(initramfs)..
I also checked the SSD (Samsung EVO 850) and I think it looks fine (?)
smartctl 6.2 2013-07-26 r3841 [x86_64-linux-3.13.0-85-lowlatency] (local build) Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 850 EVO 250GB
Serial Number: S21PNXDG907533P
LU WWN Device Id: 5 002538 d405c9bac
Firmware Version: EMT01B6Q
User Capacity: 250,059,350,016 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Thu May 12 21:05:02 2016 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 133) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always - 0
9 Power_On_Hours 0x0032 099 099 000 Old_age Always - 117
12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 79
177 Wear_Leveling_Count 0x0013 099 099 000 Pre-fail Always - 1
179 Used_Rsvd_Blk_Cnt_Tot 0x0013 100 100 010 Pre-fail Always - 0
181 Program_Fail_Cnt_Total 0x0032 100 100 010 Old_age Always - 0
182 Erase_Fail_Count_Total 0x0032 100 100 010 Old_age Always - 0
183 Runtime_Bad_Block 0x0013 100 100 010 Pre-fail Always - 0
187 Uncorrectable_Error_Cnt 0x0032 100 100 000 Old_age Always - 0
190 Airflow_Temperature_Cel 0x0032 069 059 000 Old_age Always - 31
195 ECC_Error_Rate 0x001a 200 200 000 Old_age Always - 0
199 CRC_Error_Count 0x003e 100 100 000 Old_age Always - 0
235 POR_Recovery_Count 0x0012 099 099 000 Old_age Always - 2
241 Total_LBAs_Written 0x0032 099 099 000 Old_age Always - 597710729
SMART Error Log Version: 1
No Errors Logged
Warning! SMART Self-Test Log Structure error: invalid SMART checksum.
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 117 -
# 2 Short offline Aborted by host 80% 117 -
# 3 Extended offline Completed without error 00% 117 -
# 4 Extended offline Completed without error 00% 116 -
# 5 Short offline Completed without error 00% 116 -
# 6 Extended offline Completed without error 00% 116 -
Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
I asked already in another forum but didn't get any advice that's why I try it here.
Any advice is highly appreciated :)
I'm new to this forum and quite new to Ubuntu, so you can call me a noob. I have UBUNTU KXSTUDIO Studio (Ubuntu 14.04.4 LTS) running on a new PC since January this year. There was a kernel update 3 days ago and after this update i'm not able to boot with the kernel 3.13.0-86-lowlatency. However with kernel version 3.13.0-85-lowlatency it works after I entered grub. The message I get is:
— Boot args (cat /proc/cmdline)
— Check rootdelay= (did the system wait long enough?)
— Check root= (did the system wait for the right device?)
— Missing modules (cat /proc/modules; ls /dev)
ALERT! /dev/disk/kxstudio--vg-root does not exist. Dropping to a shell!
BusyBox v.1.21.1 (ubuntu 1:1.21.0-1ubuntu1) built-in shell (ash)
Enter 'help' for list of built-in commands .
(initramfs)..
I also checked the SSD (Samsung EVO 850) and I think it looks fine (?)
smartctl 6.2 2013-07-26 r3841 [x86_64-linux-3.13.0-85-lowlatency] (local build) Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 850 EVO 250GB
Serial Number: S21PNXDG907533P
LU WWN Device Id: 5 002538 d405c9bac
Firmware Version: EMT01B6Q
User Capacity: 250,059,350,016 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Thu May 12 21:05:02 2016 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 133) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always - 0
9 Power_On_Hours 0x0032 099 099 000 Old_age Always - 117
12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 79
177 Wear_Leveling_Count 0x0013 099 099 000 Pre-fail Always - 1
179 Used_Rsvd_Blk_Cnt_Tot 0x0013 100 100 010 Pre-fail Always - 0
181 Program_Fail_Cnt_Total 0x0032 100 100 010 Old_age Always - 0
182 Erase_Fail_Count_Total 0x0032 100 100 010 Old_age Always - 0
183 Runtime_Bad_Block 0x0013 100 100 010 Pre-fail Always - 0
187 Uncorrectable_Error_Cnt 0x0032 100 100 000 Old_age Always - 0
190 Airflow_Temperature_Cel 0x0032 069 059 000 Old_age Always - 31
195 ECC_Error_Rate 0x001a 200 200 000 Old_age Always - 0
199 CRC_Error_Count 0x003e 100 100 000 Old_age Always - 0
235 POR_Recovery_Count 0x0012 099 099 000 Old_age Always - 2
241 Total_LBAs_Written 0x0032 099 099 000 Old_age Always - 597710729
SMART Error Log Version: 1
No Errors Logged
Warning! SMART Self-Test Log Structure error: invalid SMART checksum.
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 117 -
# 2 Short offline Aborted by host 80% 117 -
# 3 Extended offline Completed without error 00% 117 -
# 4 Extended offline Completed without error 00% 116 -
# 5 Short offline Completed without error 00% 116 -
# 6 Extended offline Completed without error 00% 116 -
Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
I asked already in another forum but didn't get any advice that's why I try it here.
Any advice is highly appreciated :)