Here you are:
Code:
lubuntu@lubuntu:~$ sudo smartctl -a /dev/sda
smartctl 5.43 2012-06-30 r3573 [x86_64-linux-3.8.0-19-generic] (local build)
Copyright (C) 2002-12 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Device Model: Hitachi HTS543232A7A384
Serial Number: E24312430N76BH
LU WWN Device Id: 5 000cca 694c93278
Firmware Version: ES2OA60W
User Capacity: 320,072,933,376 bytes [320 GB]
Sector Size: 512 bytes logical/physical
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 8
ATA Standard is: ATA-8-ACS revision 6
Local Time is: Wed Aug 28 20:47:57 2013 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: FAILED!
Drive failure expected in less than 24 hours. SAVE ALL DATA.
See vendor-specific Attribute list for failed Attributes.
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 45) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 95) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 086 086 062 Pre-fail Always - 7733252
2 Throughput_Performance 0x0005 100 100 040 Pre-fail Offline - 0
3 Spin_Up_Time 0x0007 212 212 033 Pre-fail Always - 1
4 Start_Stop_Count 0x0012 099 099 000 Old_age Always - 2985
5 Reallocated_Sector_Ct 0x0033 001 001 005 Pre-fail Always FAILING_NOW 0
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 100 100 040 Pre-fail Offline - 0
9 Power_On_Hours 0x0012 097 097 000 Old_age Always - 1393
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 2908
191 G-Sense_Error_Rate 0x000a 100 100 000 Old_age Always - 0
192 Power-Off_Retract_Count 0x0032 098 098 000 Old_age Always - 515
193 Load_Cycle_Count 0x0012 096 096 000 Old_age Always - 49906
194 Temperature_Celsius 0x0002 187 187 000 Old_age Always - 32 (Min/Max 13/45)
196 Reallocated_Event_Count 0x0032 054 054 000 Old_age Always - 1264
197 Current_Pending_Sector 0x0022 001 001 000 Old_age Always - 2980
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0
223 Load_Retry_Count 0x000a 100 100 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 5702 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 5702 occurred at disk power-on lifetime: 1393 hours (58 days + 1 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 03 bd 0b 00 00 Error: UNC at LBA = 0x00000bbd = 3005
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 08 08 10 43 da 40 00 00:10:04.517 READ FPDMA QUEUED
60 08 00 a8 0b 80 40 00 00:10:04.517 READ FPDMA QUEUED
60 08 00 a0 0b 80 40 00 00:10:04.498 READ FPDMA QUEUED
60 08 08 08 43 da 40 00 00:10:04.498 READ FPDMA QUEUED
60 08 00 98 0b 80 40 00 00:10:04.498 READ FPDMA QUEUED
Error 5701 occurred at disk power-on lifetime: 1393 hours (58 days + 1 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 03 bd 0b 00 00 Error: UNC at LBA = 0x00000bbd = 3005
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 08 00 b8 41 da 40 00 00:10:01.268 READ FPDMA QUEUED
60 08 08 b8 0b 00 40 00 00:10:01.268 READ FPDMA QUEUED
60 08 10 48 0b 80 40 00 00:10:01.268 READ FPDMA QUEUED
60 08 00 b0 41 da 40 00 00:10:01.268 READ FPDMA QUEUED
60 08 08 b0 0b 00 40 00 00:10:01.268 READ FPDMA QUEUED
Error 5700 occurred at disk power-on lifetime: 1393 hours (58 days + 1 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 03 bd 0b 00 00 Error: UNC at LBA = 0x00000bbd = 3005
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 08 00 c8 41 da 40 00 00:09:43.378 READ FPDMA QUEUED
60 08 08 b8 0b 00 40 00 00:09:43.364 READ FPDMA QUEUED
60 08 00 c0 41 da 40 00 00:09:43.364 READ FPDMA QUEUED
ef 10 02 00 00 00 a0 00 00:09:43.364 SET FEATURES [Reserved for Serial ATA]
27 00 00 00 00 00 e0 00 00:09:43.364 READ NATIVE MAX ADDRESS EXT
Error 5699 occurred at disk power-on lifetime: 1393 hours (58 days + 1 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 03 bd 0b 00 00 Error: UNC at LBA = 0x00000bbd = 3005
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 08 00 c0 41 da 40 00 00:09:40.166 READ FPDMA QUEUED
60 08 08 b8 0b 00 40 00 00:09:40.166 READ FPDMA QUEUED
60 08 00 b8 41 da 40 00 00:09:40.166 READ FPDMA QUEUED
60 08 08 b0 0b 00 40 00 00:09:40.166 READ FPDMA QUEUED
60 08 00 b0 41 da 40 00 00:09:40.166 READ FPDMA QUEUED
Error 5698 occurred at disk power-on lifetime: 1393 hours (58 days + 1 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 03 bd 0b 00 00 Error: UNC at LBA = 0x00000bbd = 3005
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 08 00 08 0b 80 40 00 00:09:23.091 READ FPDMA QUEUED
60 08 08 b8 0b 00 40 00 00:09:23.074 READ FPDMA QUEUED
60 08 00 00 0b 80 40 00 00:09:23.074 READ FPDMA QUEUED
ef 10 02 00 00 00 a0 00 00:09:23.074 SET FEATURES [Reserved for Serial ATA]
27 00 00 00 00 00 e0 00 00:09:23.074 READ NATIVE MAX ADDRESS EXT
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed: read failure 90% 1379 219
# 2 Extended offline Completed: read failure 90% 1379 5014428
# 3 Short offline Completed: read failure 50% 1369 219
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
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