Problem
Diskutility reports harddisk errors from time to time. The attributes that are failing are all listed as 'undefined' in diskutility. I am not quite sure how something that is not defined can be failing, as 'undefined' implies there is no definition of failure. If a screenshot helps to shed light on the problem, I am willing to provide it. I will have to wait for the error to come up again.
When refreshing the SMART data in Diskutility it reports 'the disk has been used outside design parameters in the past'.
Technical data of hardware involved
Technical data of the harddisk is pasted below between [code] tags.
Actions taken
I searched this forum and found the thread 'Hard disk problem detected' (http://ubuntuforums.org/showpost.php?p=11832735&postcount=3). I executed the SMART-self test, results below:
Code:
~$ sudo smartctl -a /dev/sda
[sudo] password for [username]:
smartctl 5.41 2011-06-09 r3365 [x86_64-linux-3.0.0-19-generic] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG HD161HJ
Serial Number: [serial number]
LU WWN Device Id: 5 0000f0 09b617481
Firmware Version: JF100-15
User Capacity: 160,041,885,696 bytes [160 GB]
Sector Size: 512 bytes logical/physical
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 8
ATA Standard is: ATA-8-ACS revision 3b
Local Time is: Sun May 6 13:17:26 2012 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 3044) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 51) minutes.
SCT capabilities: (0x003f) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 100 100 051 Pre-fail Always - 0
3 Spin_Up_Time 0x0007 253 253 025 Pre-fail Always - 4480
4 Start_Stop_Count 0x0032 096 096 000 Old_age Always - 4190
5 Reallocated_Sector_Ct 0x0033 253 253 010 Pre-fail Always - 0
7 Seek_Error_Rate 0x000f 253 253 051 Pre-fail Always - 0
8 Seek_Time_Performance 0x0025 253 253 015 Pre-fail Offline - 0
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 22976
10 Spin_Retry_Count 0x0033 253 253 051 Pre-fail Always - 0
11 Calibration_Retry_Count 0x0012 253 253 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 097 097 000 Old_age Always - 3068
13 Read_Soft_Error_Rate 0x000e 100 100 000 Old_age Always - 50707722
184 End-to-End_Error 0x0033 253 253 099 Pre-fail Always - 0
187 Reported_Uncorrect 0x0032 253 253 000 Old_age Always - 0
188 Command_Timeout 0x0032 253 253 000 Old_age Always - 0
190 Airflow_Temperature_Cel 0x0022 163 130 000 Old_age Always - 25 (Min/Max 1/36)
194 Temperature_Celsius 0x0022 163 001 000 Old_age Always - 25 (Min/Max 0/37)
195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age Always - 50707722
196 Reallocated_Event_Count 0x0032 253 253 000 Old_age Always - 0
197 Current_Pending_Sector 0x0012 253 253 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 253 253 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x000a 100 100 000 Old_age Always - 0
201 Soft_Read_Error_Rate 0x000a 100 100 000 Old_age Always - 0
202 Data_Address_Mark_Errs 0x0032 253 253 000 Old_age Always - 0
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 22976 -
# 2 Extended offline Completed without error 00% 22561 -
# 3 Short offline Completed without error 00% 22525 -
# 4 Short offline Completed without error 00% 10937 -
# 5 Short offline Completed without error 00% 21 -
Note: selective self-test log revision number (0) not 1 implies that no selective self-test has ever been run
SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Question
Should I replace the disk? I read the article on https://en.wikipedia.org/wiki/S.M.A.R.T. and the correlation between SMART failures and disk failures appears to be questionable.
Backup
I do make backups which are stored on Ubuntu One.
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